=== START OF INFORMATION SECTION === Model Family: Seagate SV35 Device Model: ST2000VX000-9YW164 Serial Number: Z1E0BCYK LU WWN Device Id: 5 000c50 03fc7eb48 Firmware Version: CV12 User Capacity: 2,000,398,934,016 bytes [2.00 TB] Sector Sizes: 512 bytes logical, 4096 bytes physical Device is: In smartctl database [for details use: -P show] ATA Version is: 8 ATA Standard is: ATA-8-ACS revision 4 Local Time is: Tue Oct 29 00:18:41 2013 MSK SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED See vendor-specific Attribute list for marginal Attributes. General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 575) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 220) minutes. Conveyance self-test routine recommended polling time: ( 2) minutes. SCT capabilities: (0x10b9) SCT Status supported. SCT Error Recovery Control supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 117 099 006 Pre-fail Always - 154727872 3 Spin_Up_Time 0x0003 096 095 000 Pre-fail Always - 0 4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 65 5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0 7 Seek_Error_Rate 0x000f 064 060 030 Pre-fail Always - 2651280 9 Power_On_Hours 0x0032 029 029 000 Old_age Always - 62282 10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 63 184 End-to-End_Error 0x0032 100 100 099 Old_age Always - 0 187 Reported_Uncorrect 0x0032 079 079 000 Old_age Always - 21 188 Command_Timeout 0x0032 100 100 000 Old_age Always - 0 189 High_Fly_Writes 0x003a 088 088 000 Old_age Always - 12 190 Airflow_Temperature_Cel 0x0022 053 043 045 Old_age Always In_the_past 47 (0 133 47 37 0) 191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 0 192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 57 193 Load_Cycle_Count 0x0032 070 070 000 Old_age Always - 61206 194 Temperature_Celsius 0x0022 047 057 000 Old_age Always - 47 (0 24 0 0 0) 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 24 198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 24 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0 SMART Error Log Version: 1 ATA Error Count: 17 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 17 occurred at disk power-on lifetime: 60918 hours (2538 days + 6 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 00 08 ff ff ff 4f 00 10d+10:25:48.974 READ FPDMA QUEUED ef 10 02 00 00 00 a0 00 10d+10:25:48.973 SET FEATURES [Reserved for Serial ATA] 27 00 00 00 00 00 e0 00 10d+10:25:48.973 READ NATIVE MAX ADDRESS EXT ec 00 00 00 00 00 a0 00 10d+10:25:48.973 IDENTIFY DEVICE ef 03 46 00 00 00 a0 00 10d+10:25:48.973 SET FEATURES [Set transfer mode] Error 16 occurred at disk power-on lifetime: 60918 hours (2538 days + 6 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 00 08 ff ff ff 4f 00 10d+10:25:46.195 READ FPDMA QUEUED 60 00 08 ff ff ff 4f 00 10d+10:25:46.186 READ FPDMA QUEUED 60 00 08 ff ff ff 4f 00 10d+10:25:46.173 READ FPDMA QUEUED ef 10 02 00 00 00 a0 00 10d+10:25:46.173 SET FEATURES [Reserved for Serial ATA] 27 00 00 00 00 00 e0 00 10d+10:25:46.173 READ NATIVE MAX ADDRESS EXT Error 15 occurred at disk power-on lifetime: 60918 hours (2538 days + 6 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 00 08 ff ff ff 4f 00 10d+10:25:42.406 READ FPDMA QUEUED 60 00 00 ff ff ff 4f 00 10d+10:25:42.406 READ FPDMA QUEUED ef 10 02 00 00 00 a0 00 10d+10:25:42.405 SET FEATURES [Reserved for Serial ATA] 27 00 00 00 00 00 e0 00 10d+10:25:42.405 READ NATIVE MAX ADDRESS EXT ec 00 00 00 00 00 a0 00 10d+10:25:42.405 IDENTIFY DEVICE Error 14 occurred at disk power-on lifetime: 60918 hours (2538 days + 6 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 00 40 ff ff ff 4f 00 10d+10:25:39.612 READ FPDMA QUEUED 60 00 20 ff ff ff 4f 00 10d+10:25:39.581 READ FPDMA QUEUED 60 00 40 ff ff ff 4f 00 10d+10:25:39.579 READ FPDMA QUEUED 60 00 20 ff ff ff 4f 00 10d+10:25:39.572 READ FPDMA QUEUED 60 00 08 ff ff ff 4f 00 10d+10:25:39.563 READ FPDMA QUEUED Error 13 occurred at disk power-on lifetime: 60126 hours (2505 days + 6 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 00 ff ff ff 0f Error: UNC at LBA = 0x0fffffff = 268435455 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- 60 00 08 ff ff ff 4f 00 27d+04:49:43.750 READ FPDMA QUEUED 60 00 08 ff ff ff 4f 00 27d+04:49:43.750 READ FPDMA QUEUED 60 00 08 ff ff ff 4f 00 27d+04:49:43.750 READ FPDMA QUEUED 60 00 08 ff ff ff 4f 00 27d+04:49:43.749 READ FPDMA QUEUED 60 00 08 ff ff ff 4f 00 27d+04:49:43.487 READ FPDMA QUEUED SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.